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NCITS Announces the Public Review Comment Period for NCITS 322:199x, Card Durability Test Methods Working Paper

NCITS (National Committee for Information Technology Standards)

NEWS RELEASE

Doc. No.: PR/98-008
Reply to: Barbara Bennett at bbennett@itic.nw.dc.us

NCITS Announces the Public Comment Period for NCITS 322:199x, Card Durability Test Methods Working Paper

Washington D.C., February 1998 - NCITS Announces the Public Comment Period for Card Durability Test Methods Working Paper. Development of this draft standard is being done in technical committee B10, Identification Cards and Related Devices.

The public review extends from March 13, 1998 to May 13, 1998.

This American National Standard describes Test Methods for the evaluation of durability of Identification (ID) cards. An ID card is defined as a card identifying its holder and issuer which may carry data required as input for the intended use of the card.

These test methods are to be used by card issuers, card manufacturers and card component suppliers to make comparisons of performance of ID cards. These test methods do not imply a specific correlation to end use field performance or a given card service life. However, these test methods may be useful for ranking or comparing the relative durability of ID cards.

Results obtained by use of these test methods should not be represented as equivalent to field use performance or an absolute index of ultimate card service unless a degree of quantitative correlation has been established for the ID card material construction in question.

These test methods do not possess and do not constitute requirements for ID cards in general. The reader is referred to specific application standards for performance requirements and acceptance criteria. It is the responsibility of card issuers and their suppliers to decide which attributes are required for card performance in given card application and to mutually agree which test method may be appropriate to assess card performance.

This standard may involve hazardous materials, operations and equipment. This standard does not purport to address all safety problems associated with its use. It is the responsibility of the user of this standard to established appropriate safety and health practices and determine the applicability of local and federal regulatory limitation prior to use.

Submit all comments to:

NCITS Secretariat
Attn.: Barbara Bennett
1250 Eye Street, NW
Suite 200
Washington, DC 20005
Email: bbennett@itic.nw.dc.us.

Send a copy to:

ANSI
Attn.: BSR Center
11 West 42nd St.
New York, NY 10036
Email: (wluk@ansi.org).

A call for possible patents and pertinent issues (copyrights, trademarks) is also being issued. Please submit information on these issues to the NCITS Secretariat at 1250 Eye Street NW, Suite 200, Washington DC 20005. Email: NCITS @itic.nw.dc.us

Copies of NCITS 322:199x may be purchased from:

Global Engineering Documents
15 Inverness Way East
Englewood, CO 80112- 5704
Ph: 1-800-854-7179 or 303-792-2181.